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完勝大考英語7000單字：初級篇1~2500字(附app開通序號)

為了解決Ping tool的問題，作者空中英語教室編輯群 這樣論述：

本書特色 　　單字 + 實用片語與搭配詞 + 例句 　　點線面方式學習單字用法，有效率的增加字彙量！ 　　由空中英語教室編輯群整理編撰，清楚閱讀，讓你完勝大考！ 　　1.收錄曾出現在歷屆學測、指考、統測考題中的實用初級字彙。 　　2.列出實用片語與搭配詞等延伸用法，靈活運用單字。 　　3.特別強調搭配詞（Collocation），有助培養語感。 　　4.採單元學習方式，每25字一回，循序漸進學單字。 　　5.每回皆有練習題，有效評估學習狀況。 　　6.附贈完勝大考7000單字APP序號，學習不間斷，充份利用零碎時間，走到哪聽到哪，走到哪背到哪。 　　※ 為何搭配詞那麼重要呢？ 　　

想要講一句話，但是語塞講不出來，因為「不知道要用什麼字表達心中所想的東西」。有時會覺得自己的英文看似「字字是英文」，但其實「句句不是英文」，不知如何道地、精準地使用英文。有了搭配詞，你不會再害怕開口說英文；出國在外，跟外國人交談再也不用支支吾吾，很順利地就能講出流利的句子。這，就是搭配詞的力量。 　　◎ 單字APP與單字書內容的差異： 　　1.    單字APP：主要單字＋例句，並附音檔。 　　提供適合手機介面互動的練習題 　　聽發音猜中文音思 　　聽發音猜英文拚法 　　聽發音猜單字 　　2.    單字書：主要單字表及例句，附上實用片語與搭配詞等衍生用法，並搭配例句。 　　書中提供練習

題：初級及中級80回，中高級76回。便於讀者更深入學習單字的使用情境。  

Ping tool進入發燒排行的影片

An Integrated Approach For Uncovering Novel DNA Methylation Biomarkers For Non-small Cell Lung Carcinoma

為了解決Ping tool的問題，作者VAIBHAV KUMAR SUNKARIA 這樣論述：

Introduction - Lung cancer is one of primal and ubiquitous cause of cancer related fatalities in the world. Leading cause of these fatalities is non-small cell lung cancer (NSCLC) with a proportion of 85%. The major subtypes of NSCLC are Lung Adenocarcinoma (LUAD) and Lung Small Cell Carcinoma (LUS

C). Early-stage surgical detection and removal of tumor offers a favorable prognosis and better survival rates. However, a major portion of 75% subjects have stage III/IV at the time of diagnosis and despite advanced major developments in oncology survival rates remain poor. Carcinogens produce wide

spread DNA methylation changes within cells. These changes are characterized by globally hyper or hypo methylated regions around CpG islands, many of these changes occur early in tumorigenesis and are highly prevalent across a tumor type.Structure - This research work took advantage of publicly avai

lable methylation profiling resources and relevant comorbidities for lung cancer patients extracted from meta-analysis of scientific review and journal available at PubMed and CNKI search which were combined systematically to explore effective DNA methylation markers for NSCLC. We also tried to iden

tify common CpG loci between Caucasian, Black and Asian racial groups for identifying ubiquitous candidate genes thoroughly. Statistical analysis and GO ontology were also conducted to explore associated novel biomarkers. These novel findings could facilitate design of accurate diagnostic panel for

practical clinical relevance.Methodology - DNA methylation profiles were extracted from TCGA for 418 LUAD and 370 LUSC tissue samples from patients compared with 32 and 42 non-malignant ones respectively. Standard pipeline was conducted to discover significant differentially methylated sites as prim

ary biomarkers. Secondary biomarkers were extracted by incorporating genes associated with comorbidities from meta-analysis of research articles. Concordant candidates were utilized for NSCLC relevant biomarker candidates. Gene ontology annotations were used to calculate gene-pair distance matrix fo

r all candidate biomarkers. Clustering algorithms were utilized to categorize candidate genes into different functional groups using the gene distance matrix. There were 35 CpG loci identified by comparing TCGA training cohort with GEO testing cohort from these functional groups, and 4 gene-based pa

nel was devised after finding highly discriminatory diagnostic panel through combinatorial validation of each functional cluster.Results – To evaluate the gene panel for NSCLC, the methylation levels of SCT(Secritin), FOXD3(Forkhead Box D3), TRIM58(Tripartite Motif Containing 58) and TAC1(Tachikinin

1) were tested. Individually each gene showed significant methylation difference between LUAD and LUSC training cohort. Combined 4-gene panel AUC, sensitivity/specificity were evaluated with 0.9596, 90.43%/100% in LUAD; 0.949, 86.95%/98.21% in LUSC TCGA training cohort; 0.94, 85.92%/97.37 in GEO 66

836; 0.91,89.17%/100% in GEO 83842 smokers; 0.948, 91.67%/100% in GEO83842 non-smokers independent testing cohort. Our study validates SCT, FOXD3, TRIM58 and TAC1 based gene panel has great potential in early recognition of NSCLC undetermined lung nodules. The findings can yield universally accurate

and robust markers facilitating early diagnosis and rapid severity examination.

Globalizing Japanese Philosophy as an Academic Discipline

為了解決Ping tool的問題，作者Chun-chiehHuang,Wing-keungLam 這樣論述：

　　The book is divided into two parts, namely “Japanese Philosophy: Teaching and Research in the Global World” and “Japanese Philosophy as an Academic Discipline.” The first part integrates reports on the state of teaching and research of Japanese philosophy. The areas discussed are Japan,

Canada, France, Spain and Englishspeaking regions. The second part contains contributions on various topics of Japanese philosophy, such as papers on Nishida Kitaro, Kuki Shuzo, Tanabe Hajime to Sakabe Megumi as a contemporary thinker. These articles not only show the topics of Japanese philosophica

l debate, but also the potential of Japanese philosophical thoughts.

應用於標準元件與印刷電路板設計之繞線技術研究

為了解決Ping tool的問題，作者林世庭 這樣論述：

繞線於積體電路設計中為一必要且被廣泛應用的階段，隨著製程不斷演進，大量的訊號數量與複雜的設計規範大幅提高了繞線問題的複雜度。現今已有許多電子設計自動化(EDA)的工具與演算法被提出來克服複雜的晶片層級繞線，不過仍有一些重要的繞線問題是現存的演算法難以跟人工繞線產出近似的品質的，如標準元件繞線與印刷電路板繞線，這會導致工程師需花費大量時間與精力來完成這些繞線工作。因此，此論文擬提出許多的繞線方法以產出就算與人工繞線相比亦具有競爭力的繞線結果。因此，我們將提出之方法分為兩大主題，自動化標準元建合成與印刷電路板繞線。於自動化的標準元件合成，我們提出了第一個可以全自動合成標準元件庫並考慮drain-

to-drain abutment (DDA)於7奈米鰭式場效電晶體，我們首先提出基於動態規劃演算法的考慮DDA之電晶體擺放方法，並提出基於整數線性規劃之最佳化金屬第0層(M0)規劃演算法以降低第1金屬層(M1)的繞線擁擠度，所以標準元件的輸出入接點(I/O pin)的接入能力也因第2金屬層(M2)的使用量減少而提高。另一方面，我們分析有兩個主要原因導致自動化的標準元件繞線難以跟人工繞線產出近似的品質，其一為自動化的繞線難以完全使用元件中的空間，另外一個原因是以往的標準元件繞線研究並沒有考慮電容耦合所帶來的效能影響。因此，我們提出可隱式動態調整之繞線圖來繞線可以提高繞線資源的使用，我們也將考慮

電容耦合的繞線演算法轉成二次式規劃的方城組來最佳化標準元件的效能。實驗結果證實我們的標準元件庫不只可以幫助減少晶片的面積達5.73%，亦可以提供具有更好的面積與效能的標準元件。多行高的標準元件架構已在現今的設計中越來越流行，但卻沒有被以往的研究完整的討論，在此論文中，我們提出一個完整的擺放與繞線流程與方法以合成多行高的標準元件。我們提出一個基於A*搜尋演算法的多行高電晶體擺放方法以最佳化內行與跨行的連接能力，我們亦提出第一個基於最大化可滿足(Max-SAT)演算法的細部繞線器，其可以最佳化連接線長並滿足基本的設計規範。實驗結果證實我們所合成的標準元件與目前先進的單行標準元件具有近似的品質，且因

我們的多行高標準元件具有較好的長寬比，所以可以在合成晶片時具有更好的彈性。最後，因為越來越高的接點密度與繞線層數，印刷電路板繞線變得越來越複雜。印刷電路板繞線可分為兩個階段，逃離繞線與區域繞線。傳統的逃離繞線只專注於讓接點之連線逃離該晶片區塊，但未考慮其逃離位置對於晶片繞線的可繞度之影響。在此論文中，我們提出了一個完整的印刷電路板繞線流程與方法，其包含了同時性逃離繞線、後繞線最佳化、與區域繞線，而我們所提之印刷電路板繞線可以完成七個目前商業用印刷電路板繞線軟體無法完成的業界印刷電路板設計。 另外，在考慮業界提供之可製造性規範後，我們所提出的逃離繞線依然可以在加入額外設計的方城組後完成所有業界提

供的設計